The AFM-1000 from Semilab is a versatile atomic force microscope designed for both academic research and semiconductor industry applications. This compact system offers high-resolution, sub-atomic precision measurements with extremely low noise levels, ideal for consistent nanotopography measurements and electrical characterization of various samples up to 65x65 mm in size.
With cutting-edge technology and decades of knowhow, Semilab tabletop AFM system provides to your academic research microscopic measurement solutions based on semiconductor industry standards.
• Designed for R&D use: Materials science, semiconductor device research, advanced metrology
• Wide sample compatibility for various research applications
• Proven track record of Semilab AFM product family: Cited in multiple scientific publications
• AFM scanner utilizing flexure-guided piezo positioners for flat scanner movement
• Configurable scan area size
• Integrated dual focus camera system for laser alignment and tip-to-sample positioning
• Compact tabletop AFM system with small footprint for R&D applications
• Easy and safe sample and cantilever handling
• Manually adjustable laser path
• Motorized sample stage
• Sample holder: clamps or magnetic fixing
• High level of automation: series of different measurements can be automatically carried out on a single sample
