FPP-1006 Four-Point Probe Measurement

• Accurate sheet resistance measurement for thin semiconductor, TCO, and metal layers
  
  
• Sample materials: Si, epitaxial layers, metal/implanted layers on Si
  
  
• Widely used in PV industry, thin film resistance measurements, and R&D
  
  
• Industry standard 6-point probe method with Semilab reliability and support

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• 6-electrode contact probe eliminating contact resistance effects
  
  
• Fast measurement time (~1 second per point)
  
  
• Manual operation, repeated measurements on the same spot possible (probe tips wear over time)
  
  
• Max sample size: 220 × 220 mm (standard in PV industry)
  
  
• Fully customizable measurement parameters

• Graphical user interface, SEM compatible

• Semilab proprietary SEM software
  
  
• Data export formats: TXT, CSV
  
  
• Supports I-V curve measurement
  
  
• No calibration required
  

• Warranty: 8 years
  
  
• Probe tip lifetime: ~100,000 contacts; consumable, replace upon wear
  
  
• Maintenance interval: every 4-5 months
  
  
• Tabletop device, movable
  
  
• Wide selection of Jandel probe heads available