This compact tabletop Spectroscopic Ellipsometer delivers precise thin film and optical property measurements in a modular, lab-friendly design. Covering a wide spectral range (190 nm–25 µm), it supports film thickness, refractive index, absorption, and multilayer analysis with flexible measurement modes including ellipsometry, polarimetry, and transmission.

  • Widely used in universities, academic research labs, photovoltaic (PV) R&D, optical coating research, and pilot-scale production
  • Ideal for thin film thickness and refractive index measurement, multilayer stack analysis, and transmission/reflection studies
  • Works across a spectral range of 190 nm to 25 µm without sample removal or system change (spectral range options from 245–1000 nm or 380–1000 nm available)
  • Suitable for thin dielectric films, oxides, nitrides, porous films, very thin metal layers, graphene, liquids, 3D nanostructures, organic layers (OLEDs, polymers), TCO, lithography gratings, and free liquid surfaces
  • Measures film thickness, refractive index (n), extinction coefficient (k), absorption coefficient, band gap, and composition

  • Compact tabletop ellipsometer designed for precise thin film and optical property measurement
  • Manual goniometer with 60°–75° rotation steps (optionally up to 40°)
  • Precision sample positioning table with fast automatic spectroscopic data acquisition
  • Operable by trained operators; data evaluation requires technical expertise
  • Recipe-driven measurement flow, no full automation, but supports scheduled measurements
  • User-friendly graphical interface
  • Measurement time: from 167 ms to 10+ seconds depending on configuration and sample
  • Modular and expandable before and after installation
  • Fits on standard lab benches (compact footprint)

  • Uses Semilab proprietary data format compatible with SEA evaluation software
  • Supports export to .csv for external data analysis
  • Includes advanced analysis software for film thickness, optical properties, and multilayer analysis
  • Measurement modes include spectroscopic ellipsometry with rotating compensator, step and scan mode, generalized ellipsometry (anisotropic samples), Mueller matrix (11 coefficients), Jones matrix, polarimetry, and transmission at 90°
  • Standard 8-year product lifetime
  • UV lamp replacement every ~3 months (typical 1000–3000 hrs lifespan)
  • Full training, installation, and ongoing support options available
  • Typical lead time: 4–6 months
  • Ships with all necessary accessories and spares tailored to customer needs
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SE-1000 Spectroscopic Ellipsometry

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