This compact tabletop Spectroscopic Ellipsometer delivers precise thin film and optical property measurements in a modular, lab-friendly design. Covering a wide spectral range, it supports film thickness, refractive index, extinction ratio coefficient , and multilayer analysis with flexible measurement modes including ellipsometry, polarimetry, and twelve element Mueller-matrix.
• Widely used in universities, academic research labs, photovoltaic (PV) R&D, optical coating research, and pilot-scale production
• Measures thin film thickness, refractive index (n), extinction coefficient (k), band gap, and composition
• Suitable for:
• Compact tabletop ellipsometer designed for precise thin film and optical property measurement
• Manual goniometer with 60°–75° rotation steps (optionally up to 40°)
• Precision sample positioning table with fast automatic spectroscopic data acquisition
• Recipe-driven measurement flow, supports scheduled measurements
• User-friendly graphical interface
• Measurement time: min. 167 ms, typically 1-5s
• Modular and expandable after installation
• Fits on standard lab benches (compact footprint)
• Wavelength range: 380 nm – 1000 nm (wavelength extension available on additional cost)
• Manual goniometer: 60° - 90°;
• Adjustment step: 5° for 60° - 75° range (wider range available on request on additional cost)
• Adjustable beam diameter: up to 5 mm diameter (Microspot is not included by default, it is available as option)
• Fixed sample stage: up to 200 mm diameter samples
