The IND-1500 is anadvanced nanoindentation system for precise mechanical property measurement at the micro- to nanoscale, including elastic modulus, hardness, fracture toughness, and viscoelastic behavior. With independent sensors, vibration isolation, and automated control, it ensures robust, reproducible results across diverse materials from semiconductors and ceramics to polymersand biomaterials.

  • Used in materials science, semiconductors, ceramics, polymers, biomaterials (dental, bone), hydrogels, metals
  • Measures mechanical properties of hard thin films, multi-phase metals, ceramics, soft films, semiconductors, plastics
  • Applicable for charge carrier concentration and mobility measurement in semiconductor and thermoelectric materials
  • Optional Atomic Force Microscope integration for surface imaging and damage investigation
  • Enables high-resolution depth profiling and analysis of superhard thin films, polymers, minerals, and more
  • Adhesion of thin films with one of the highest scratch lengths on the market
  • Advanced nanoindentation tester for quantitative mechanical property measurement at micro- to nanoscale
  • Measures elastic modulus, hardness, yield strength, storage and loss moduli, fracture toughness
  • Independent force and displacement sensors for sophisticated results of high scientific standard
  • High robustness and damage resistance
  • Closed and isolated enclosure with noise and vibration isolation
  • Precise sample positioning via video microscope and software control
  • Suitable for research labs, adaptable for industrial use
  •  User-friendly graphical interface; automated and customizable measurement sequences
  • Easy indenter tip changeover
  • ISO standard: ISO14577-2015
  • Scratch tester option capable of handling up to 100 mm scratch length
  • Metrology modes:
    • Static and quasi-static
    • Dynamic
    • SPM function
    • NanoScratch testing
    • Creep
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