PDL-1000 Photo Hall Measurement

• Precise mobility and carrier concentration measurement, including low mobility and semi-insulating samples
• Electrical characterization of semiconductors, photovoltaics, thermoelectrics, and novel materials
• Minority and majority carrier mobilities, recombination lifetime and diffusion length with the Carrier-Resolved Photo-Hall option
• Temperature dependent measurement with the LN2 cryostat option down to 80K

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• Parallel Dipole Line (PDL) Hall measurements
• AC and DC magnetic fields with permanent magnets
• Handles a wide mobility range including extremely low mobilities
• Supports both AC and DC Hall measurements without bulky electromagnets (uses rotating permanent magnets)
• Software-based lock-in detection for improved signal extraction
• Compact, robust tabletop design
• Optionally available:
  • Gate bias voltage option
  • Standalone 5 colored Signal Tower
  • Vibration isolation stage
  • High resistance option up to 200 GOhm
  • Low resistance option for increasing the sensitivity on highly conducting materials
  • White light background illumination option

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• Sensitivity & Range:
      Measures carrier mobility down to <0.01 cm²/V·s
      Magnetic field strength ~2.5 Tesla peak-to-peak
      Uniformity <2% for 5x5 mm samples
• Options:
  • CRPH carrier resolved photo-Hall measurement for minority carrier mobility, lifetime and diffusion length
    • 830 nm, 637 nm, 520 nm, 460 nm illumination (two selectable)
    • 10 x 10 mm spot size
    • Up to 3 Suns
  • LN2 cryostat for temperature dependent measurement
    • 80-350K