1999
•
Proceedings of the Diagnostic Techniques for Semiconductor Materials and Devices, 1999 Joint Int. Meeting, 196)

Determination of Recombination Center Parameters by the Combined Application of µ-PCD and SPV Techniques

Read the publication
Header image

Abstract

Topic

recombination center, Microwave Photoconductive Decay (μ-PCD), surface photovoltage

Author

T. Pavelka, A. Tóth, G. Bayer
Read the publication

Related Products

See our related products to this publication:
No items found.

Contact us for Information and Pricing

Get expert advice and tailored solutions for your research needs
Get in touch