2008
Technical & Scientific Meeting of ARCSIS, 20-21 Nov., STUniversity in Fuveau, France 2008)

Fabrication and Characterisation Challenges on Ultra Shallow Junctions for sub 45 nm CMOS Devices

Header image

Abstract

Topic

ultra-shallow junction (USJ)

Author

F. Torregrosa, H. Etienne, G. Sempere, G. Mathieu, L. Roux, C. Grosjean, R. Daineche, Y. De Puydt, L. Dupuy, P. Galand, A. Pap, K. Kis-Szabo, T. Pavelka

Related Products

See our related products to this publication:
No items found.

Contact us for Information and Pricing

Get expert advice and tailored solutions for your research needs