1996
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J. Electrochem. Soc., 143, No. 1, 216-220

Identification Possibility of Metallic Impurities in p-Type Silicon by Lifetime Measurement

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Abstract

Topic

oxidation, Silicon (Si), temperature, nitrogen compounds, oxygen compounds, quartz, surface treatment

Author

T.S. Horányi, P. Tüttő, Cs. Kovacsics
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