1999
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Proceedings of the International Semiconductor Device Research Symposium (Charlottesville 1999), pp. 539-542

Temperature dependence of carrier recombination lifetimes in n-type silicon

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A. Frohnmeyer, F.-J. Niedernostheide, H.-J. Schulze, P. Tüttő, T. Pavelka, G. Wachutka
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